Original site (chinees)

MTester is a tool to messure all kind of electronic components.

See also this youtube video

Google Translation

pcb size: 63 * 71 mm Weight: about 48g

LCR-T4 graphical multi-function tester resistor + capacitor + diode + SCR + inductance + + mos tube triode

12864 LCD for liquid crystal displays, with backlight, backlight color is generally yellow-green.

9v battery powering stacked. If the power supply for a long time, you can use two 8.4v lithium battery pack consisting of.

Function

• Added boot voltage detection function
• Automatic detection of NPN and PNP transistors, N-channel and P-channel MOSFET, diode (including dual diodes), thyristors, transistors, resistors and capacitors and other components,
• Automatic test out the pin element and displayed on the LCD
• can determine emission testing transistor, MOSFET protection diodes magnification factor and base of the forward bias voltage of the transistor gate threshold voltage
• Measurement and gate capacitance of the MOSFET
• 12864 lcd display uses LCD (128 * 64 characters)
• higher test speed, valid for component testing: in 2 seconds (except in the larger capacitors, large capacitance measurement also takes a long time, the measurement time of 1 minutes is normal)
• One button operation, start the test, get a key.
• Power consumption shutdown mode: less than 20 nA of
• Auto-off function, to avoid unnecessary waste, conserve battery power, improve battery life.

The following functions for the M8 and M168 Advanced Edition version differs **** please choose according to their needs

• Using ATmega8, ATmega168 or ATmega328 microcontroller.
• 2x16-character LCD display the results.
• One button operation, auto power off.
• Shutdown current is only 20nA, support for battery operation.
• Low-cost version without the crystal, auto power off. 1.05k version of the software ATmega168 or ATmega328 in sleep mode when no measurement to reduce power consumption.
• Automatic detection PNP and NPN type bipolar transistors, N, P-channel MOSFET, JFET, diode, a double diode, thyristor SCR.
• Automatic detection pin layout.
• Measuring current amplification factor of the bipolar transistor and the threshold voltage emitter junction.
• Darlington transistor amplification factor can be identified by the high threshold voltage and high current.
• For bipolar transistor, MOSFET protection diode testing.
• Measuring the threshold voltage and the gate capacitance of the MOSFET.
• Supports two resistance measurements and symbols show the highest four numbers and units. Both ends of the resistor symbol is shown connected to the tester probes number (1-3). Therefore, the potential can also be measured. If the potentiometer is adjusted to its end, the tester can not distinguish between the middle and the ends of the pin.
• Resistance measurement resolution is 0.1 ohms, the highest measured value 50M ohms.
• Can be detected and measured a capacitor. Maximum four numbers and units. Values ​​can be from 25pf (8MHz clock, 50pF @ 1MHz clock) to 100mF. Resolution up to 1 pF (@ 8MHz clock).
• Can be larger than the value for 2UF capacitor equivalent series resistance (ESR) measured capacitance value. Resolution of 0.01 ohms and a two-digit numeric display. This feature requires at least 16K Flash ATMEGA (ATmega168 or ATmega328).
• Two diodes can display symbols in the right direction. In addition, the forward voltage drop displayed.
• LED detection for diode forward voltage drop is much higher than normal. Dual LEDs detected as double diode.
• Zener diode can be detected, if the reverse breakdown voltage is less than 4.5V. This will appear as two diodes, can only be determined by the voltage. Probe around the diode symbol is the same, in which case, you can 700mV threshold voltage close to the true recognition diode anode!
• This year to understand, do not turn the

If more than three diode type parts inspection, failure to establish the number of diodes another message. This will only happen if the diode is connected to all three probes and at least one diode. In this case, you should only connect the two probes and start measuring again, one by one.

• Measurement of a single diode reverse capacitance. Bipolar transistors also can measure, if you connect the base and collector or emitter.
• Only one measurement to find full-bridge connection.
• 25pf capacitor value is lower than usual undetectable, but with a diode in parallel or at least 25pf capacitor in parallel. In this case, you have to subtract part shunt capacitance values.
• Less than 2100 ohm resistors will measure inductance, if you have at least 16K ATMEGA flash. Range from 0: 01mH than 20H, but the accuracy is not good. Measurement results show only a single connection element.
• Test time is about two seconds, capacitance and inductance measurements will only take a long time.
• Software can be set to automatically turn off the power measurement times before.
• Built-in self-test function with selectable clock frequency of 50Hz signal check the accuracy and wait for the call (ATmega168 and ATmega328).
• Optional internal resistance and zero offset calibration of measuring equipment self-test capability of the port output (ATmega168 and ATmega328). Need a 100nF to 20uF capacitor connected to compensate the analog comparator between pins 1 and 3 of the offset voltage. This can reduce the measurement error 40uF above capacitor. With the same internal calibration capacitor voltage reference voltage is found to internal adjustment reference measurement ADC gain.

If the test current exceeds the holding current, the thyristor and triac can be detected. But some current higher than the semiconductor SCR and triac tester can provide the trigger current. Available test current is only about 6mA! Note that all functions have only used single-chip program memory as more ATmega168.